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Application of Atomic Force Microscopy on Particle Characterization
This publication highlights the application of Atomic Force Microscopy (AFM) for nanoparticle characterization, emphasizing its superior resolution and versatility compared to other techniques. AFM provides accurate three-dimensional measurements of particle size, shape, and surface properties, suitable for particles ranging from 1 nm to 50 µm. Unlike optical or electron microscopy, AFM operates in various environments, including air, vacuum, liquids, and extreme temperatures, with minimal sample preparation.
AFM enables precise height-based size measurements of isolated particles and lateral size determinations for densely packed samples. Advanced data processing software facilitates statistical analysis, such as size distribution and particle sorting. Additionally, AFM can distinguish material properties using phase imaging, which is sensitive to differences in stiffness, adhesion, and chemical composition.
Applications include characterizing subnanometer particles, mixed polymer materials, and coated nanoparticles. AFM’s unparalleled spatial resolution and material differentiation capabilities make it indispensable for nanotechnology, materials science, and particle-based applications.