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Basics of AFM:
A 60 min presentation lecturing the Basics. The basics the imaging mechanism of atomic force microscopy technology. How scanner is designed and how do scanners scan, how contact mode detects sample, how tapping mode tip interact with attractive and repulsive force with a molecule. We will also touch base on the basic principles of feed back loop different working mechanism of contact mode and tapping mode.
Basics of AFM design and construction:
A 60 min presentation about more AFM basics. Tip sample interaction, tip convolution, image resolution limitation and more.
Calibration your controller:
This 60 min lecture discuss the initial installation and set up of an AFM lab, followed by calibration of the scanner, calibration of the controller electronics, and basic trouble shootings of the controller.
Basics of contact mode:
AFM contact mode is the most fundamental imaging mode allow user to obtain highest resolution on selected sample at relatively higher speed. This 60 min presentation described the basic concept of AFM contact mode and its application in air, in liquid, acquiring atomic steps, atomic resolution images on selected samples.
Basics of tapping mode:
Tapping mode is the most widely used AFM imaging mode allowing user to acquire on most of the samples. This 60 min lecture discuss the basic concept of tapping mode, attractive force, repulsive force and how to manipulate force using basic parameters. We will explain how to judge and optimize force interaction using phase and amplitude channels.
Basics of tapping mode-2
Tapping mode is the most widely used AFM imaging mode allowing user to acquire on most of the samples. This 60 min lecture is the second part of discussion of tapping mode, further discuss the basic concept of tapping mode, attractive force, repulsive force and how to manipulate force using basic parameters. We will discuss the procedure of imaging resolution optimization in tapping mode image of biological molecules.
Basics of tapping mode: attractive and repulsive force
Tapping mode is the most widely used AFM imaging mode allowing user to acquire on most of the samples. This 60 min lecture is the 3rd part of the presentation, discuss the in more depth of control the tip sample in attractive force vs repulsive force region, and achieve desired resolution.
Achieve high resolution with contact mode, measuring laser power drift:
AFM contact mode is the most fundamental imaging mode allow user to obtain highest resolution on selected sample at relatively higher speed. This 60 min presentation is the second part of contact mode discussion. Some advanced examples were discussed such as constant height mode or constant force mode in contact mode. described the basic concept of AFM contact mode and its application in air, in liquid, acquiring atomic steps, atomic resolution images on selected samples. We will also demonstrate the measuring of laser power to assess the health of laser diode of the AFM scanner.
Advanced imaging mode based on oscillation, EFM, KFM, MFM, MSM:
In this 60 min lecture, advanced imaging modes are discussed, including EFM, KFM, MFM and Magnetic sample modulation imaging mode. We will present examples of application along with working principle.
Basics of Sample Preparation:
Basic concept and topics of AFM sample preparation is discussed in this 60 min lecture. We will touch the topic of substrate choice, such as HOPG, mica and Au(111), sample cleaning, sample fixing and sample immobilization of biological molecules for liquid imaging.
In-situ image in liquid:
AFM imaging in liquid environment opens many doors allow you to study surface chemical physical reactions. This lecture discuss the topic the problem, solution, benefit and special application examples of imaging a sample in liquid.
Force curve topic:
AFM force curve is a very unique topic. Force curve allow one to study the mechanical property of a molecular bond, molecular folding and material nanometer mechanical property. This lecture discusses the theory, practice, problems and solutions in performing force curve using atomic force microscope.
In-situ AFM imaging of lithium battery solid-electrolyte interface (SEI):
In-situ study of lithium battery is a very difficult application using atomic force microscope. You need to imaging an electrochemistry reaction in-situ under full atmosphere protection with oxygen free environment. This 60 min lecture discuss the challenges, problems and solutions in in-situ observation of solid-electrolyte interface (SEI) formation during charging discharging circle in a glove box.