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Applications of KFM and CSAFM/STM in Characterizations of Photovoltaic Materials
This publication highlights the use of Kelvin Force Microscopy (KFM) and Current-Sensing AFM (CSAFM) for characterizing photovoltaic (PV) materials. These techniques provide nanoscale insights into the electronic, structural, and transport properties of materials critical for solar cell efficiency.
KFM quantitatively maps surface potential, enabling the study of grain boundaries, doping profiles, and electron work function variations in materials like CuInSe2 (CIS) and organic PVs. For example, KFM revealed how sodium segregation enhances carrier separation at grain boundaries in CIS-based solar cells, improving efficiency.
CSAFM complements KFM by mapping localized conductivity, elucidating electron transport mechanisms in polycrystalline materials and across junctions in multi-junction cells. The integration of CSAFM with optical excitation further allows investigation of photocurrent effects.
These advanced AFM-based methods are invaluable for optimizing PV materials by correlating nanoscale morphology with electronic performance, thus driving advancements in sustainable energy technologies.