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PFM Experiments with High Voltage DC/AC Bias
This publication discusses the use of Piezoelectric Force Microscopy (PFM) with high-voltage AC and DC bias to study ferroelectric materials. PFM is essential for imaging nanoscale piezoelectric properties, domain switching, and local hysteresis in ferroelectric materials. The demand for higher voltages arises from the need to switch polarization in low-response materials and enhance signal-to-noise ratios for weak piezoelectric effects.
The document details various experimental configurations using Agilent AFM systems, including standard setups with MAC III controllers and enhanced setups incorporating the Signal Access Box or high-voltage amplifiers. High-voltage configurations allow polarization switching in materials like periodically poled lithium niobate (PPLN) and polyvinylidene fluoride (PVDF) films, revealing domain dynamics and hysteresis behaviors.
Key findings include the role of applied voltage in increasing switching completeness and signal strength, providing insights into ferroelectric material performance. These setups offer robust platforms for advanced PFM experiments in materials science and device research.
Piezoresponse Force Microscopy
This publication explores Piezoresponse Force Microscopy (PFM), a scanning probe technique leveraging the reverse piezoelectric effect to investigate nanoscale piezoelectric and ferroelectric properties. PFM measures a material’s mechanical response to an applied electric field, providing insight into piezoelectric behavior with sub-nanometer resolution.
The methodology involves applying an AC bias, often with a DC offset, to a conductive AFM tip in contact with the sample. The resulting piezoresponse, measured through the cantilever’s deflection, reveals polarization states and domain structures. PFM also allows spectroscopy to map piezoresponse versus variables like applied bias, enabling the study of hysteresis and other characteristics.
Applications span materials science and nanotechnology, including ferroelectric thin films for memory devices and piezoelectric materials in sensors and actuators. By differentiating polarization states and mapping electromechanical properties, PFM provides an essential tool for understanding material behavior at molecular and nanometer scales.