AFM Probes

AFM can measure surface topography, roughness, elasticity, adhesion, friction, and electrical or magnetic properties depending on the probe and imaging mode used. It is widely applied to characterize biological samples like DNA and proteins, polymers, thin films, battery electrode materials, and hard materials requiring nanomechanical indentation testing.

AFM offers sub-nanometer vertical resolution and can resolve lateral features down to a few nanometers, depending on tip sharpness, cantilever stiffness, and imaging mode. Contact and tapping modes typically deliver the highest resolution, while environmental factors such as vibration and thermal drift can affect overall measurement accuracy if not properly controlled.

AFM stands for Atomic Force Microscopy, a scanning probe technique that uses a cantilever with a sharp tip to image and measure surface properties at the nanoscale. It is distinct from optical or electron microscopy because it physically interacts with the sample surface, enabling measurements in air, liquid, or controlled gas environments.

For imaging biological samples such as DNA, proteins, or live cells, soft cantilevers with low spring constants designed for liquid imaging or tapping mode are recommended. These minimize sample damage while maintaining sufficient sensitivity to capture fine structural details in aqueous environments.

Our cantilevers and probes are compatible with all major brand AFM systems. If you need help confirming mounting geometry or electrical connection compatibility for your specific instrument, contact our team with your system model before you order.

Yes, AFM is capable of imaging sample topographic change during electrochemistry reaction, the silicon or silicon nitride cantilever can sustain corrosive environment in electrolyte, and provide in-situ study of electrochemistry reaction. we have successfully used PicoPlus AFM to observe SEI formation in Lithium battery first charging circle, want to learn more, please contact us.