AFM Mica Discs

The mica substrates are provided in a 2 cm substrate size format. This large substrate dimension provides an ample surface area for mounting specimens, facilitating ease of sample preparation during routine microscopy workflows, high-resolution nanoscale imaging, and surface characterization procedures across academic and industrial research laboratory environments.

An atomically flat surface is crucial in atomic force microscopy because surface irregularities or roughness on the substrate can obscure nanoscale sample features. Standard mica material provides an exceptionally smooth and flat baseline, ensuring that any topographical variations detected during high-resolution surface imaging correspond directly to the sample rather than the underlying substrate.

Yes, these mica substrates are engineered specifically for atomic force microscopy sample preparation, mounting, and calibration applications. Their standard mica material construction and atomically flat surface ensure compatibility across atomic force microscopy instruments used for nanoscale surface characterization, nanotechnology research, and high-resolution imaging workflows across laboratories.

Pricing for our 2 cm mica substrates is available on request. You can contact our technical sales team directly by phone or through our website contact form to request an official quote, inquire about purchase options, and discuss specific technical requirements for your laboratory application.

Molecular Imaging provides comprehensive technical support to assist researchers with atomic force microscopy workflows. Customers can access fast online support via ZoomAFM to receive technical guidance on AFM sample preparation, substrate mounting techniques, and system calibration directly from our experienced microscopy specialists who have deep institutional knowledge.

Yes, these mica substrates are designed for atomic force microscopy calibration alongside routine sample preparation. The atomically flat and smooth properties of the mica material make it a reliable calibration standard type for surface characterization, enabling researchers to verify baseline surface conditions prior to conducting high-resolution experiments.