MFM Frequencies

Frequency modulation (FM) is a technique where a signal's frequency varies to encode information. In AFM/MFM systems, a related concept—frequency modulation detection—is used to track shifts in cantilever resonance frequency caused by magnetic or force interactions, improving imaging sensitivity.

MFM is used to visualize magnetic domain structures on sample surfaces, commonly for characterizing magnetic storage media, thin films, and nanostructured magnetic materials. It works by detecting magnetic force gradients between a magnetized tip and the sample, producing high-resolution magnetic contrast images.

The MFM nose cone attaches to the modular top-down scanner configuration, allowing researchers to switch between MFM and other imaging modes such as AFM, STM, or KPFM without replacing the entire system, reducing cost and downtime between experiments.

MFM is best suited for magnetic thin films, hard drive media, nanowires, and other ferromagnetic or ferrimagnetic materials. Non-magnetic samples will not produce meaningful MFM contrast, so complementary AFM topography scans are typically performed alongside MFM measurements.

The PicoPlus AFM/STM Systems (5500 Series) support scan ranges of 9\u03bcm x 9\u03bcm or 90\u03bcm x 90\u03bcm depending on the scanner configuration, providing flexibility for both fine nanoscale detail and broader magnetic domain mapping.

Yes, temperature, humidity, and vibration can influence cantilever resonance stability and magnetic tip performance. The system's environmental isolation chamber helps control humidity, temperature, and gas composition to maintain consistent, drift-free MFM frequency measurements.