
Mica Substrate 2cm
- Ultra-smooth mica surface for AFM calibration
- Compact 2cm size fits standard AFM stages
- Ideal for nanotechnology and materials research
Discover muscovite mica substrates designed for atomic force microscopy (AFM). Featuring atomically flat and smooth surfaces, these 2 cm substrates provide clean baselines for high-resolution surface imaging, sample mounting, AFM calibration, and rigorous nanoscale surface characterization across materials science and nanotechnology research laboratories.




In scanning probe microscopy, mica is used primarily as a flat substrate for atomic force microscopy sample preparation, AFM calibration, microscopy sample mounting, and high-resolution surface imaging across materials science, nanotechnology, and surface-characterization laboratories.
Talk to our experts for custom solutions and tailored guidance.

Supports high-resolution surface characterization, thin-film analysis, and nanoscale research.

Enables sample mounting and baseline calibration for precision atomic force microscopy.
Talk to our experts for custom solutions and tailored guidance.
Engineered with smooth, atomically flat surfaces for high-resolution AFM imaging.
Backed by 25 years of discovery and innovation from former Molecular Imaging leaders.
Receive expert guidance and fast technical assistance via ZoomAFM online support.
Connect with our technical support team to receive pricing information and product guidance.
For immediate assistance, feel free to give us a direct call at 1-888-644-0389. You can also send us a quick email at songxu@nanocuetech.com.
For immediate assistance, feel free to give us a direct call at 1-888-644-0389. You can also send us a quick email at songxu@nanocuetech.com.