Calibration Substrates

Calibration substrates include periodic gratings for lateral dimension verification, step-height standards for vertical Z-axis calibration, and dopant standards for semiconductor profiling. Additionally, atomically flat mica substrates and gold thin films on mica provide dependable platforms for high-resolution imaging, surface roughness characterization, and routine instrument validation across various scanning probe microscopy modes.

Periodic grating standards feature precisely defined repeating structures, such as a 500 nm grating period, designed to calibrate lateral XY dimensions. By scanning these known structures, researchers verify scanner linearity, detect lateral distortion, and confirm dimensional measurement accuracy. This ensures that nanoscale feature measurements across microscopy and nanotechnology applications remain dependable and consistent over time.

Step-height calibration standards provide precisely defined physical step features to calibrate and verify the AFM vertical or Z-axis. Scanning these height references confirms that vertical sensor response accurately translates to physical surface elevations. This verification supports reliable surface topography measurements, film thickness determinations, and general quality control during nanometrology and dimensional standards research.

Dopant calibration standards feature known concentration regions of n-type or p-type dopants in silicon. They enable quantitative calibration for specialized electrical SPM modes, including scanning capacitance microscopy, scanning microwave microscopy, and scanning spreading resistance microscopy. These standards provide reference measurements necessary for accurate dopant profiling and reproducible semiconductor device characterization.

Mica substrates provide an atomically flat, smooth cleavage surface ideal for mounting nanoscale samples and performing high-resolution atomic force microscopy imaging. Their exceptional surface uniformity minimizes background roughness, making them suitable for thin-film analysis, biomolecular characterization, and instrument performance verification where substrate planar quality directly influences measurement precision.

Pricing for all calibration standards and substrates is available on request. Researchers can contact Molecular Imaging via telephone or email to discuss technical specifications and order requirements. The team also offers ongoing assistance through downloadable manuals, documentation, and online support via ZoomAFM to assist with AFM system calibration and maintenance.