Probe Holders

A probe in instrumentation is a specialized sensing component that gathers data through physical or electrical contact with a sample. In AFM and STM platforms, interchangeable nose cones secure these micro-fabricated cantilevers and tips, ensuring stable mechanical alignment and providing necessary optical beam-deflection paths or electrical signal routing.

Molecular Imaging probe holders and interchangeable nose cones support a broad selection of imaging modes. Depending on the selected configuration, users can perform standard contact and tapping AFM, magnetic AC mode, scanning tunneling microscopy, conductive AFM current sensing, and scanning electrochemical microscopy on compatible instrument platforms.

Interchangeable nose cones allow laboratory researchers to switch between distinct scanning techniques without replacing the entire scanner assembly. Users can quickly exchange holders to transition between routine topography mapping, electrical characterization, or magnetic imaging, expanding the versatility of a single AFM or STM system.

These probe holders and modular nose cones are designed specifically for Molecular Imaging instrumentation platforms, including the PicoPlus 5000 and 5500 series systems. They mount directly onto the scanner head, enabling straightforward cantilever mounting and accurate alignment across diverse research workflows.

A conductive AFM nose cone features an integrated electrical connection path to the mounted conductive probe. This specialized setup permits simultaneous surface topography acquisition and nanoscale electrical current measurement, supporting thorough property analysis on conductive samples and electronic materials.

Molecular Imaging provides comprehensive technical assistance, including ZoomAFM fast online service, maintenance and repair, instrument training, and downloadable user guides and service documentation to help researchers configure and operate their probe holders effectively.